JPH0577292B2 - - Google Patents

Info

Publication number
JPH0577292B2
JPH0577292B2 JP61074900A JP7490086A JPH0577292B2 JP H0577292 B2 JPH0577292 B2 JP H0577292B2 JP 61074900 A JP61074900 A JP 61074900A JP 7490086 A JP7490086 A JP 7490086A JP H0577292 B2 JPH0577292 B2 JP H0577292B2
Authority
JP
Japan
Prior art keywords
circuit
terminal
input
output
sequential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61074900A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62230040A (ja
Inventor
Hideki Matsura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP61074900A priority Critical patent/JPS62230040A/ja
Publication of JPS62230040A publication Critical patent/JPS62230040A/ja
Publication of JPH0577292B2 publication Critical patent/JPH0577292B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP61074900A 1986-03-31 1986-03-31 半導体集積回路 Granted JPS62230040A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61074900A JPS62230040A (ja) 1986-03-31 1986-03-31 半導体集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61074900A JPS62230040A (ja) 1986-03-31 1986-03-31 半導体集積回路

Publications (2)

Publication Number Publication Date
JPS62230040A JPS62230040A (ja) 1987-10-08
JPH0577292B2 true JPH0577292B2 (en]) 1993-10-26

Family

ID=13560721

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61074900A Granted JPS62230040A (ja) 1986-03-31 1986-03-31 半導体集積回路

Country Status (1)

Country Link
JP (1) JPS62230040A (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0245971A (ja) * 1988-08-05 1990-02-15 Nec Corp 半導体集積論理回路

Also Published As

Publication number Publication date
JPS62230040A (ja) 1987-10-08

Similar Documents

Publication Publication Date Title
KR900006484B1 (ko) Ic평가회로 소자와 평가회로 소자 검사수단을 갖는 반도체 집적회로
EP0254981B1 (en) Diagnostic circuit
US4724380A (en) Integrated circuit having a built-in self test design
EP0364925A1 (en) Semiconductor integrated circuit having i/o terminals allowing independent connection test
KR890001076A (ko) 게이트어레이 및 메모리를 갖는 반도체 집적회로 장치
US5319646A (en) Boundary-scan output cell with non-critical enable path
US5796266A (en) Circuit and a method for configuring pad connections in an integrated device
KR940006230A (ko) 반도체 집적회로장치 및 그 기능시험방법
JPH0577292B2 (en])
US5465257A (en) Test signal output circuit in LSI
US4814639A (en) Super integration circuit device having a plurality of IC-chip equivalent regions formed on a single semiconductor substrate
JP2927095B2 (ja) 半導体集積回路の試験回路
EP1227502A1 (en) Connection pad arrangements for electronic circuit comprising both functional logic and flash-EEPROM
US5877648A (en) Integrated circuit having a control circuit for controlling connection of monitor points to electrode pads
JPH11166958A (ja) 半導体集積回路装置
JP2785748B2 (ja) 双方向入出力バッファ
JPH0533831B2 (en])
KR960701371A (ko) 일정 논리값을 출력하는 수단의 출력과 회로 입력간의 접속 테스팅 소자(Device for testing connection between an output of a means which outputs a fixed logic value and the input of a circuit)
JP3458551B2 (ja) 集積回路のテスト回路
JPS6342486A (ja) 試験装置
JPH04176164A (ja) 半導体集積回路
JPS6072318A (ja) 論理lsi
JPS60174963A (ja) 電子パツケ−ジ試験回路
JPH10123214A (ja) 論理回路のテスト方法及びテスト回路を含む論理回路装置
JPH03229176A (ja) 半導体集積装置

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term